The effects of decoupling capacitors in DC bias lines by measuring an implemented RF system

Jong In Ryu, Dongsu Kim, Jun Chul Kim, Hyeongdong Kim, Jong Chul Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the effect of decoupling capacitors in DC bias lines. This paper approaches the aspect of isolation between DC bias lines instead of power integrity. The effects depending on decoupling capacitors are studied in RF system by measuring the implemented wireless-personal-area-network (WPAN) system. The WPAN system is composed of a front-end-module by LTCC, a RF IC, and a baseband (FPGA) board. DC bias lines are tested and discussed from the point of view of both Z-parameter and S-parameter. The Z-parameter and S-parameter are measured by network analyzer and the performance of the system is measured. Decoupling capacitors in DC bias line are focused on when the WPAN system is performed in Tx mode. The parameter and the system performance depending DC bias lines with/without decoupling capacitors are measured. As a result, the correlations between system parameter and system performance depending on decoupling capacitors are analyzed and obtained. The correlation between parameter and system performance, the role of decoupling capacitors, and the required isolation in DC bias line by employing decoupling capacitors were discussed and reviewed in this paper. Analysis by using S-parameter was better than by using Z-parameter in order to estimate the performance of the RF system. Isolation between DC bias lines is ensured by using decoupling capacitors, and the performance is improved. Tx spectrum of the RF system was improved as the isolation between DC bias lines was increased above 15 dB.

Original languageEnglish
Title of host publicationAsia-Pacific Microwave Conference Proceedings, APMC 2011
Pages1818-1821
Number of pages4
StatePublished - 2011 Dec 1
EventAsia-Pacific Microwave Conference, APMC 2011 - Melbourne, VIC, Australia
Duration: 2011 Dec 52011 Dec 8

Publication series

NameAsia-Pacific Microwave Conference Proceedings, APMC

Other

OtherAsia-Pacific Microwave Conference, APMC 2011
CountryAustralia
CityMelbourne, VIC
Period11/12/511/12/8

Keywords

  • DC bias line
  • Isolation
  • bypass capacitor
  • decoupling capacitor
  • power integrity
  • signal integrity

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  • Cite this

    Ryu, J. I., Kim, D., Kim, J. C., Kim, H., & Park, J. C. (2011). The effects of decoupling capacitors in DC bias lines by measuring an implemented RF system. In Asia-Pacific Microwave Conference Proceedings, APMC 2011 (pp. 1818-1821). [6174126] (Asia-Pacific Microwave Conference Proceedings, APMC).