Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

Yong Il Kim, Seung Hoon Nahm, Won Bin Im, Duk Young Jeon, Duncan H. Gregory

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Blue-color emitting material, CaMgSi2O6:Eu 2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rwp, was 9.22% and the goodness-of-fit indicator, S(=Rwp/Re), was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO 2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped Eu2+ ions occupied the Ca sites (4e) and replaced 1.0% of the Ca2+ ions. The refined model of CMS:Eu 2+ describes a structure in monoclinic space group C 2/c with Z=4, a=9.7474(2) Å, b=8.9384(2) Å, c=5.2490(1) Å and β=105.87 (1)°.

Original languageEnglish
Pages (from-to)1-6
Number of pages6
JournalJournal of Luminescence
Volume115
Issue number1-2
DOIs
StatePublished - 2005 Oct 1

Fingerprint

Powder Diffraction
X-Ray Diffraction
X ray powder diffraction
R388
Ions
Rietveld method
goodness of fit
Rietveld refinement
Least-Squares Analysis
Solid state reactions
diffraction
Silicon Dioxide
ions
x rays
Color
solid state
color

Keywords

  • Blue emission
  • Photoluminescence
  • Plasma display panel
  • X-ray crystallography

Cite this

Kim, Yong Il ; Nahm, Seung Hoon ; Im, Won Bin ; Jeon, Duk Young ; Gregory, Duncan H. / Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data. In: Journal of Luminescence. 2005 ; Vol. 115, No. 1-2. pp. 1-6.
@article{11bceb53563c4170864a0fed9c23e3f9,
title = "Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data",
abstract = "Blue-color emitting material, CaMgSi2O6:Eu 2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rwp, was 9.22{\%} and the goodness-of-fit indicator, S(=Rwp/Re), was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO 2 (cristobalite) phases with refined phase fractions of 89.18(1){\%} and 10.82(2){\%}, respectively. Doped Eu2+ ions occupied the Ca sites (4e) and replaced 1.0{\%} of the Ca2+ ions. The refined model of CMS:Eu 2+ describes a structure in monoclinic space group C 2/c with Z=4, a=9.7474(2) {\AA}, b=8.9384(2) {\AA}, c=5.2490(1) {\AA} and β=105.87 (1)°.",
keywords = "Blue emission, Photoluminescence, Plasma display panel, X-ray crystallography",
author = "Kim, {Yong Il} and Nahm, {Seung Hoon} and Im, {Won Bin} and Jeon, {Duk Young} and Gregory, {Duncan H.}",
year = "2005",
month = "10",
day = "1",
doi = "10.1016/j.jlumin.2005.02.006",
language = "English",
volume = "115",
pages = "1--6",
journal = "Journal of Luminescence",
issn = "0022-2313",
number = "1-2",

}

Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data. / Kim, Yong Il; Nahm, Seung Hoon; Im, Won Bin; Jeon, Duk Young; Gregory, Duncan H.

In: Journal of Luminescence, Vol. 115, No. 1-2, 01.10.2005, p. 1-6.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

AU - Kim, Yong Il

AU - Nahm, Seung Hoon

AU - Im, Won Bin

AU - Jeon, Duk Young

AU - Gregory, Duncan H.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - Blue-color emitting material, CaMgSi2O6:Eu 2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rwp, was 9.22% and the goodness-of-fit indicator, S(=Rwp/Re), was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO 2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped Eu2+ ions occupied the Ca sites (4e) and replaced 1.0% of the Ca2+ ions. The refined model of CMS:Eu 2+ describes a structure in monoclinic space group C 2/c with Z=4, a=9.7474(2) Å, b=8.9384(2) Å, c=5.2490(1) Å and β=105.87 (1)°.

AB - Blue-color emitting material, CaMgSi2O6:Eu 2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rwp, was 9.22% and the goodness-of-fit indicator, S(=Rwp/Re), was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO 2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped Eu2+ ions occupied the Ca sites (4e) and replaced 1.0% of the Ca2+ ions. The refined model of CMS:Eu 2+ describes a structure in monoclinic space group C 2/c with Z=4, a=9.7474(2) Å, b=8.9384(2) Å, c=5.2490(1) Å and β=105.87 (1)°.

KW - Blue emission

KW - Photoluminescence

KW - Plasma display panel

KW - X-ray crystallography

UR - http://www.scopus.com/inward/record.url?scp=24044489610&partnerID=8YFLogxK

U2 - 10.1016/j.jlumin.2005.02.006

DO - 10.1016/j.jlumin.2005.02.006

M3 - Article

AN - SCOPUS:24044489610

VL - 115

SP - 1

EP - 6

JO - Journal of Luminescence

JF - Journal of Luminescence

SN - 0022-2313

IS - 1-2

ER -