Parameters for improving reliability of full color field emission display devices

J. M. Kim, J. P. Hong, J. H. Choi, Y. S. Ryu, S. S. Hong

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

Field emission display devices of 100 mm×100 mm×2.4 mm in size are fully developed with the 80 cd/m2 of brightness. Full color real images are characterized by using structural analysis and electron trajectory profiles. No cross talk between pixels is confirmed by a simulation and a process integration As a reliable process integration, phosphor screening integration of full color phosphors and conditions of high vacuum packaging are extensively investigated as a basis of mass production. In addition, the electrical reliability with a phosphor effect due to an electron excitation is studied with a lifetime test at various condition. Especially, the stability inside narrow vacuum space between anode and cathode plates is fully demonstrated with various process control parameters.

Original languageEnglish
Pages (from-to)736-740
Number of pages5
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume16
Issue number2
StatePublished - 1998 Mar 1

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