Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate

Hong Seok Lee, Armando Rastelli, Tae Whan Kim, Hong Lee Park, Oliver G. Schmidt

Research output: Contribution to journalArticle

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Microphotoluminescence (μ-PL) measurements were carried out to investigate the optical properties of single Cd0.6Zn 0.4Te/ZnTe quantum dots (QDs) grown on Si (001) substrate by using molecular beam epitaxy. The high quality of single Cd0.6Zn 0.4Te/ZnTe QDs is witnessed by resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Polarization-dependent and power-dependent μ-PL spectroscopy measurements were performed to identify the exciton, the biexciton, and the charged exciton in the emission spectra of single QDs. Furthermore a weak linearly polarized line is observed on the low energy side of the neutral exciton and is ascribed to dark exciton recombination.

Original languageEnglish
Pages (from-to)6554-6556
Number of pages3
JournalThin Solid Films
Issue number19
StatePublished - 2011 Jul 29


  • Cadmium zinc telluride
  • II-VI compound semiconductors
  • Molecular beam epitaxy
  • Photoluminescence
  • Quantum dots
  • Si substrate
  • Single dot spectroscopy

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