Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold

Geon Joon Lee, Young Pak Lee, Boo Young Jung, Sung Goo Jung, Chang Kwon Hwangbo, Jung Hoon Kim, Chong Seung Yoon

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The microstructural and the nonlinear optical properties of thin silver films were investigated near the optical percolation threshold. Thin silver films were deposited by using a thermal evaporator. From the transmission electron microscopy measurement, the sub-15-nm-thick films were found to exhibit a discontinuous network composed of metallic islands and a supporting matrix. As the film thickness was increased, the size of the metallic islands increased. From the transmission spectra of silver films with various thicknesses, the optical percolation transition was found to occur near a film thickness of 9 nm. As the film thickness was increased, the transmittance variation over the wavelength range from 800 nm to 2400 nm changed from an increasing behavior to a decreasing behavior. From the nonlinear transmission experiment employing femtosecond-laser pulses for seven different volume fractions of silver islands, the maximum nonlinear absorption was found to occur at a film thickness of 7.5 nm, a little less than the critical thickness required for optical percolation. The enhanced nonlinear absorption is thought to be due to the local field effect caused by metallic islands.

Original languageEnglish
Pages (from-to)1555-1559
Number of pages5
JournalJournal of the Korean Physical Society
Volume51
Issue number4 I
StatePublished - 2007 Oct 1

Fingerprint

film thickness
silver
optical properties
thresholds
evaporators
thick films
transmittance
transmission electron microscopy
matrices
pulses
wavelengths
lasers

Keywords

  • Metallic islands
  • Nonlinear optical properties
  • Percolation
  • Thin silver film

Cite this

Lee, G. J., Lee, Y. P., Jung, B. Y., Jung, S. G., Hwangbo, C. K., Kim, J. H., & Yoon, C. S. (2007). Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold. Journal of the Korean Physical Society, 51(4 I), 1555-1559.
Lee, Geon Joon ; Lee, Young Pak ; Jung, Boo Young ; Jung, Sung Goo ; Hwangbo, Chang Kwon ; Kim, Jung Hoon ; Yoon, Chong Seung. / Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold. In: Journal of the Korean Physical Society. 2007 ; Vol. 51, No. 4 I. pp. 1555-1559.
@article{ebb661114dd84ec68eedcb06e4929890,
title = "Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold",
abstract = "The microstructural and the nonlinear optical properties of thin silver films were investigated near the optical percolation threshold. Thin silver films were deposited by using a thermal evaporator. From the transmission electron microscopy measurement, the sub-15-nm-thick films were found to exhibit a discontinuous network composed of metallic islands and a supporting matrix. As the film thickness was increased, the size of the metallic islands increased. From the transmission spectra of silver films with various thicknesses, the optical percolation transition was found to occur near a film thickness of 9 nm. As the film thickness was increased, the transmittance variation over the wavelength range from 800 nm to 2400 nm changed from an increasing behavior to a decreasing behavior. From the nonlinear transmission experiment employing femtosecond-laser pulses for seven different volume fractions of silver islands, the maximum nonlinear absorption was found to occur at a film thickness of 7.5 nm, a little less than the critical thickness required for optical percolation. The enhanced nonlinear absorption is thought to be due to the local field effect caused by metallic islands.",
keywords = "Metallic islands, Nonlinear optical properties, Percolation, Thin silver film",
author = "Lee, {Geon Joon} and Lee, {Young Pak} and Jung, {Boo Young} and Jung, {Sung Goo} and Hwangbo, {Chang Kwon} and Kim, {Jung Hoon} and Yoon, {Chong Seung}",
year = "2007",
month = "10",
day = "1",
language = "English",
volume = "51",
pages = "1555--1559",
journal = "Journal of the Korean Physical Society",
issn = "0374-4884",
number = "4 I",

}

Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold. / Lee, Geon Joon; Lee, Young Pak; Jung, Boo Young; Jung, Sung Goo; Hwangbo, Chang Kwon; Kim, Jung Hoon; Yoon, Chong Seung.

In: Journal of the Korean Physical Society, Vol. 51, No. 4 I, 01.10.2007, p. 1555-1559.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Microstructural and nonlinear optical properties of thin silver films near the optical percolation threshold

AU - Lee, Geon Joon

AU - Lee, Young Pak

AU - Jung, Boo Young

AU - Jung, Sung Goo

AU - Hwangbo, Chang Kwon

AU - Kim, Jung Hoon

AU - Yoon, Chong Seung

PY - 2007/10/1

Y1 - 2007/10/1

N2 - The microstructural and the nonlinear optical properties of thin silver films were investigated near the optical percolation threshold. Thin silver films were deposited by using a thermal evaporator. From the transmission electron microscopy measurement, the sub-15-nm-thick films were found to exhibit a discontinuous network composed of metallic islands and a supporting matrix. As the film thickness was increased, the size of the metallic islands increased. From the transmission spectra of silver films with various thicknesses, the optical percolation transition was found to occur near a film thickness of 9 nm. As the film thickness was increased, the transmittance variation over the wavelength range from 800 nm to 2400 nm changed from an increasing behavior to a decreasing behavior. From the nonlinear transmission experiment employing femtosecond-laser pulses for seven different volume fractions of silver islands, the maximum nonlinear absorption was found to occur at a film thickness of 7.5 nm, a little less than the critical thickness required for optical percolation. The enhanced nonlinear absorption is thought to be due to the local field effect caused by metallic islands.

AB - The microstructural and the nonlinear optical properties of thin silver films were investigated near the optical percolation threshold. Thin silver films were deposited by using a thermal evaporator. From the transmission electron microscopy measurement, the sub-15-nm-thick films were found to exhibit a discontinuous network composed of metallic islands and a supporting matrix. As the film thickness was increased, the size of the metallic islands increased. From the transmission spectra of silver films with various thicknesses, the optical percolation transition was found to occur near a film thickness of 9 nm. As the film thickness was increased, the transmittance variation over the wavelength range from 800 nm to 2400 nm changed from an increasing behavior to a decreasing behavior. From the nonlinear transmission experiment employing femtosecond-laser pulses for seven different volume fractions of silver islands, the maximum nonlinear absorption was found to occur at a film thickness of 7.5 nm, a little less than the critical thickness required for optical percolation. The enhanced nonlinear absorption is thought to be due to the local field effect caused by metallic islands.

KW - Metallic islands

KW - Nonlinear optical properties

KW - Percolation

KW - Thin silver film

UR - http://www.scopus.com/inward/record.url?scp=35648995285&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:35648995285

VL - 51

SP - 1555

EP - 1559

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

SN - 0374-4884

IS - 4 I

ER -