Measurement of density profiles with pressure in MAP-II and DiPS linear devices

K. S. Chung, S. Kado, H. J. Woo, Y. J. Seo, T. Shikama, F. Scotti, G. S. Choi, K. Kurihara, Y. Kuwahara, M. J. Lee, T. Lho, S. Tanaka

Research output: Contribution to journalArticle

Abstract

Radial profiles of plasma density and electron temperature have been measured by a fast-scanning probe (FSP) system with various neutral pressures in the MAP-II and DiPS linear devices for the divertor simulation. The probe system is made of three probe tips, two of which is for a Mach probe consisting of two opposite-directional probes, and one is for an emissive probe installed on the pneumatically driven fast-scanning system with stroke of 30 cm. In MAP-H, density at the center has been varied from 1.5 × 1013 cm -3 to 0.7 × 1013 cm-3 with pressures of 5.5 to 112 mtorr, while that of DiPS varied from 3.5 × 1012 Cm-3 to 9 × 1012 cm-3 with pressures of 0.8 to 50 mtorr. Relation of density profile with the working pressure/magnetic field is analyzed by using a simple fluid model. Electron temperature at the center is also measured by the Thomson scattering method and compared with those of FSP, which is varied from 0.6 to 6.5 eV.

Original languageEnglish
Pages (from-to)69-71
Number of pages3
JournalFusion Science and Technology
Volume51
Issue number2 T.
StatePublished - 2007 Feb 1

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probes
profiles
Electron temperature
Scanning
scanning
electron energy
Thomson scattering
Plasma density
strokes
Mach number
plasma density
Scattering
Magnetic fields
Fluids
fluids
magnetic fields
simulation
temperature

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Chung, K. S., Kado, S., Woo, H. J., Seo, Y. J., Shikama, T., Scotti, F., ... Tanaka, S. (2007). Measurement of density profiles with pressure in MAP-II and DiPS linear devices. Fusion Science and Technology, 51(2 T.), 69-71.
Chung, K. S. ; Kado, S. ; Woo, H. J. ; Seo, Y. J. ; Shikama, T. ; Scotti, F. ; Choi, G. S. ; Kurihara, K. ; Kuwahara, Y. ; Lee, M. J. ; Lho, T. ; Tanaka, S. / Measurement of density profiles with pressure in MAP-II and DiPS linear devices. In: Fusion Science and Technology. 2007 ; Vol. 51, No. 2 T. pp. 69-71.
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Chung, KS, Kado, S, Woo, HJ, Seo, YJ, Shikama, T, Scotti, F, Choi, GS, Kurihara, K, Kuwahara, Y, Lee, MJ, Lho, T & Tanaka, S 2007, 'Measurement of density profiles with pressure in MAP-II and DiPS linear devices', Fusion Science and Technology, vol. 51, no. 2 T., pp. 69-71.

Measurement of density profiles with pressure in MAP-II and DiPS linear devices. / Chung, K. S.; Kado, S.; Woo, H. J.; Seo, Y. J.; Shikama, T.; Scotti, F.; Choi, G. S.; Kurihara, K.; Kuwahara, Y.; Lee, M. J.; Lho, T.; Tanaka, S.

In: Fusion Science and Technology, Vol. 51, No. 2 T., 01.02.2007, p. 69-71.

Research output: Contribution to journalArticle

TY - JOUR

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AU - Chung, K. S.

AU - Kado, S.

AU - Woo, H. J.

AU - Seo, Y. J.

AU - Shikama, T.

AU - Scotti, F.

AU - Choi, G. S.

AU - Kurihara, K.

AU - Kuwahara, Y.

AU - Lee, M. J.

AU - Lho, T.

AU - Tanaka, S.

PY - 2007/2/1

Y1 - 2007/2/1

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Chung KS, Kado S, Woo HJ, Seo YJ, Shikama T, Scotti F et al. Measurement of density profiles with pressure in MAP-II and DiPS linear devices. Fusion Science and Technology. 2007 Feb 1;51(2 T.):69-71.