Mass and charge selection of pulsed ion beams using sequential deflection pulses

Myung Mo Sung, A. H. Al-Bayati, C. Kim, J. W. Rabalais

Research output: Contribution to journalArticle

Abstract

A method of preparing ion beams of known mass and charge for time-of-flight scattering and recoiling spectrometry (TOF-SARS) using sequential deflection pulses (SDP) has been developed. A double-pulsing sequence is described in which the first pulse is used to create ion pulses and the second pulse, triggered after a suitable delay, allows only the species of interest to be transmitted to the target. A mass resolution of m/Δm=3-5 was achieved with the present system, eliminating the need for conventional mass resolution devices when high mass resolution is not required. Examples of the direct separation of Ar + and Ar2+ ions from an ion beam and separation of Ar + and Ar2+ scattering and recoiling spectra from an indium phosphide (InP) surface are provided.

Original languageEnglish
Pages (from-to)2953-2956
Number of pages4
JournalReview of Scientific Instruments
Volume65
Issue number9
DOIs
StatePublished - 1994 Dec 1

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Ion beams
deflection
ion beams
Scattering
Indium phosphide
recoilings
Ions
pulses
Spectrometry
indium phosphides
scattering
ions
spectroscopy

Cite this

Sung, Myung Mo ; Al-Bayati, A. H. ; Kim, C. ; Rabalais, J. W. / Mass and charge selection of pulsed ion beams using sequential deflection pulses. In: Review of Scientific Instruments. 1994 ; Vol. 65, No. 9. pp. 2953-2956.
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Mass and charge selection of pulsed ion beams using sequential deflection pulses. / Sung, Myung Mo; Al-Bayati, A. H.; Kim, C.; Rabalais, J. W.

In: Review of Scientific Instruments, Vol. 65, No. 9, 01.12.1994, p. 2953-2956.

Research output: Contribution to journalArticle

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