Luminance-degradation compensation based on multistream self-attention to address thin-film transistor-organic light emitting diode burn-in

Seongchel Park, Kwan Ho Park, Joon Hyuk Chang

Research output: Contribution to journalArticlepeer-review

Abstract

We propose a deep-learning algorithm that directly compensates for luminance degradation because of the deterioration of organic light-emitting diode (OLED) devices to address the burn-in phenomenon of OLED displays. Conventional compensation circuits are encumbered by high cost of the development and manufacturing processes because of their complexity. However, given that deep-learning algorithms are typically mounted onto systems on chip (SoC), the complexity of the circuit design is reduced, and the circuit can be reused by only relearning the changed characteristics of the new pixel device. The proposed approach comprises deep-feature generation and multistream self-attention, which decipher the importance of the variables, and the correlation between burn-in-related variables. It also utilizes a deep neural network that identifies the nonlinear relationship between extracted features and luminance degradation. Thereafter, luminance degradation is estimated from burn-in-related variables, and the burn-in phenomenon can be addressed by compensating for luminance degradation. Experiment results revealed that compensation was successfully achieved within an error range of 4.56%, and demonstrated the potential of a new approach that could mitigate the burn-in phenomenon by directly compensating for pixel-level luminance deviation.

Original languageEnglish
Article number3182
JournalSensors
Volume21
Issue number9
DOIs
StatePublished - 2021 May 1

Keywords

  • Artificial intelligence
  • Compensation circuit
  • Convolutional neural networks
  • Deep neural network
  • Luminance degradation
  • Organic light-emitting diode (OLED)
  • Thin-film transistor (TFT)

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