This paper presents a low-power and small-sized scan driver using amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs). Power consumption of the proposed scan driver is reduced by eliminating unnecessary charging current of the scan line and reducing the voltage swing of clock signals. In the proposed scan driver, area of the output stage, which requires large-sized driving TFTs, is also reduced by merging TFTs for charging and discharging the scan line into one TFT and using non-overlapping clock signals. Compared to the previous scan driver, power consumption and area of the output stage of the proposed scan driver is reduced by 21% and 40%, respectively. The proposed scan driver has power consumption of 27.4 μW per stage at the operating frequency of 46 kHz and the area per stage is 1153×192 μm2.
|Number of pages||4|
|Journal||Digest of Technical Papers - SID International Symposium|
|Publication status||Published - 2012 Jan 1|
|Event||49th SID International Symposium, Seminar and Exhibition, dubbed Display Week, 2012 - Boston, United States|
Duration: 2012 Jun 3 → 2012 Jun 8