Heat Treatment Effects of CoCr Sputtered Films

Pyung Woo Jang, Taek Dong Lee, Young-Ho Kim, Tak Kang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Thermomagnetic analyses of rf-sputtered Co84Cr16and Co78Cr22films were studied. In both specimens, Ms decreased with increasing temperature, then dropped abruptly upon holding at high temperature when the specimens were heated lower than hcp - fcc transformation temperature. This was interpreted as a phenomenon associated with Cr redistribution from Cr rich region. When the heating temperature was raised higher than hcp - fcc transformation temperature, there was a Ms jump. By comparing angular dependency of coercivities of the as-sputtered and heat treated films, we studied origin of perpendicular anisotropy also.

Original languageEnglish
Pages (from-to)1623-1625
Number of pages3
JournalIEEE Transactions on Magnetics
Volume26
Issue number5
DOIs
StatePublished - 1990 Jan 1

Fingerprint

Heat treatment
Temperature
Coercive force
Anisotropy
Heating

Cite this

Jang, Pyung Woo ; Lee, Taek Dong ; Kim, Young-Ho ; Kang, Tak. / Heat Treatment Effects of CoCr Sputtered Films. In: IEEE Transactions on Magnetics. 1990 ; Vol. 26, No. 5. pp. 1623-1625.
@article{ef1bb7bb512246dc80827760b77f2f17,
title = "Heat Treatment Effects of CoCr Sputtered Films",
abstract = "Thermomagnetic analyses of rf-sputtered Co84Cr16and Co78Cr22films were studied. In both specimens, Ms decreased with increasing temperature, then dropped abruptly upon holding at high temperature when the specimens were heated lower than hcp - fcc transformation temperature. This was interpreted as a phenomenon associated with Cr redistribution from Cr rich region. When the heating temperature was raised higher than hcp - fcc transformation temperature, there was a Ms jump. By comparing angular dependency of coercivities of the as-sputtered and heat treated films, we studied origin of perpendicular anisotropy also.",
author = "Jang, {Pyung Woo} and Lee, {Taek Dong} and Young-Ho Kim and Tak Kang",
year = "1990",
month = "1",
day = "1",
doi = "10.1109/20.104468",
language = "English",
volume = "26",
pages = "1623--1625",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
number = "5",

}

Heat Treatment Effects of CoCr Sputtered Films. / Jang, Pyung Woo; Lee, Taek Dong; Kim, Young-Ho; Kang, Tak.

In: IEEE Transactions on Magnetics, Vol. 26, No. 5, 01.01.1990, p. 1623-1625.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Heat Treatment Effects of CoCr Sputtered Films

AU - Jang, Pyung Woo

AU - Lee, Taek Dong

AU - Kim, Young-Ho

AU - Kang, Tak

PY - 1990/1/1

Y1 - 1990/1/1

N2 - Thermomagnetic analyses of rf-sputtered Co84Cr16and Co78Cr22films were studied. In both specimens, Ms decreased with increasing temperature, then dropped abruptly upon holding at high temperature when the specimens were heated lower than hcp - fcc transformation temperature. This was interpreted as a phenomenon associated with Cr redistribution from Cr rich region. When the heating temperature was raised higher than hcp - fcc transformation temperature, there was a Ms jump. By comparing angular dependency of coercivities of the as-sputtered and heat treated films, we studied origin of perpendicular anisotropy also.

AB - Thermomagnetic analyses of rf-sputtered Co84Cr16and Co78Cr22films were studied. In both specimens, Ms decreased with increasing temperature, then dropped abruptly upon holding at high temperature when the specimens were heated lower than hcp - fcc transformation temperature. This was interpreted as a phenomenon associated with Cr redistribution from Cr rich region. When the heating temperature was raised higher than hcp - fcc transformation temperature, there was a Ms jump. By comparing angular dependency of coercivities of the as-sputtered and heat treated films, we studied origin of perpendicular anisotropy also.

UR - http://www.scopus.com/inward/record.url?scp=0025494073&partnerID=8YFLogxK

U2 - 10.1109/20.104468

DO - 10.1109/20.104468

M3 - Article

AN - SCOPUS:0025494073

VL - 26

SP - 1623

EP - 1625

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 5

ER -