Self-organized formation of Si nanodot arrays on the oxidized Si(1 0 0) surfaces has been studied using scanning tunneling microscopy. The growth of the oxide layer and subsequent Si deposition have been conducted under ultra-high vacuum conditions. Number density of the grown Si nanodots was in the range from 3×1012 to 8×1012 cm-2 and their average size varied from 3 to 5 nm. Effect of the SiO2 layer thickness (0.2-2.2 nm), amount of deposited Si (0.5-7.5 ML) and growth temperature (60-450 °C) on the Si nanodot number density and size distribution has been determined.
- Atom-solid interactions
- Scanning tunneling microscopy (STM)
- Surface structure, morphology, roughness, and topography