External compensation of non-uniform electrical characteristics of thin-film transistors and degradation of OLED devices in AMOLED displays

Hai Jung In, Oh Kyong Kwon

Research output: Contribution to journalArticle

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Abstract

The variation of electrical characteristics of polycrystalline-silicon thin-film transistor (TFT) and degradation of organic light-emitting-diode (OLED) device cause nonuniform intensity of luminance and image sticking in active-matrix OLED (AMOLED) displays. An external compensation method that senses and compensates variations of threshold voltage and mobility of TFTs and degradation of OLED device is proposed. The effect of the external compensation method on AMOLED pixel is experimentally verified by measuring the luminance of OLEDs and the electrical characteristics of TFTs in AMOLED pixels.

Original languageEnglish
Pages (from-to)377-379
Number of pages3
JournalIEEE Electron Device Letters
Volume30
Issue number4
DOIs
Publication statusPublished - 2009 Mar 10

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Keywords

  • Degradation
  • External compensation
  • Organic light-emitting diode (OLED)
  • Polycrystalline-silicon thin-film transistor (TFT)

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