Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer

Chang Kyu Lee, Jong Sung Kwon, In Chul Na, Byung Il Han, Young Min Kim, Jea Gun Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrated a nonvolatile memory fabricated with the sandwich device structure of Al/Au nano-crystals embedded in the PVK/Al. The bi-stable conduction switching characteristic (Ion/Ioff ratio) was >1×102, depending on Au nano-crystal size. The size and distribution of Au nano-crystals were determined by the inserted Au-layer thickness between PVK layers. The size of Au nano-crystals increased with the inserted Au-layer thickness. The uniform distribution of isolated Au nano-crystals was obtained with 5 nm of the inserted Au-layer thickness.

Original languageEnglish
Title of host publicationAdvances in Nanomaterials and Processing - IUMRS - ICA - 2006 International Conference in Asia
PublisherTrans Tech Publications Ltd
Pages33-36
Number of pages4
EditionPART 1
ISBN (Print)3908451310, 9783908451310
DOIs
StatePublished - 2007 Jan 1
EventIUMRS International Conference in Asia 2006, IUMRS-ICA 2006 - Jeju, Korea, Republic of
Duration: 2006 Sep 102006 Sep 14

Publication series

NameSolid State Phenomena
NumberPART 1
Volume124-126
ISSN (Print)1012-0394

Other

OtherIUMRS International Conference in Asia 2006, IUMRS-ICA 2006
CountryKorea, Republic of
CityJeju
Period06/09/1006/09/14

Keywords

  • Au nano-crystal
  • Bistability
  • Curing
  • Nonvolatile memory
  • PBD
  • PVK

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  • Cite this

    Lee, C. K., Kwon, J. S., Na, I. C., Han, B. I., Kim, Y. M., & Park, J. G. (2007). Dependency of electrical characteristics on Au nano-crystal size for non-volatile memory fabricated with Au nano-crystal embedded in PVK(poly(N-vinylcarbazole)) layer. In Advances in Nanomaterials and Processing - IUMRS - ICA - 2006 International Conference in Asia (PART 1 ed., pp. 33-36). (Solid State Phenomena; Vol. 124-126, No. PART 1). Trans Tech Publications Ltd. https://doi.org/10.4028/3-908451-31-0.33