Atomic parameters for Monte Carlo transport simulation: Survey, validation and induced systematic effects

H. Seo, M. G. Pia, L. Quintieri, M. Begalli, P. Saracco, Chan Hyeong Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A wide survey has been performed, concerning atomic binding energies and ionization energies used by well-known general purpose Monte Carlo codes and a few specialized electromagnetic models for track structure simulation. Validation results are reported.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages90-94
Number of pages5
DOIs
StatePublished - 2010 Dec 1
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: 2010 Oct 302010 Nov 6

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
CountryUnited States
CityKnoxville, TN
Period10/10/3010/11/6

Fingerprint

Nuclear Energy
Electromagnetic Phenomena
binding energy
electromagnetism
ionization
simulation
energy
Surveys and Questionnaires

Cite this

Seo, H., Pia, M. G., Quintieri, L., Begalli, M., Saracco, P., & Kim, C. H. (2010). Atomic parameters for Monte Carlo transport simulation: Survey, validation and induced systematic effects. In IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010 (pp. 90-94). [5873722] (IEEE Nuclear Science Symposium Conference Record). https://doi.org/10.1109/NSSMIC.2010.5873722
Seo, H. ; Pia, M. G. ; Quintieri, L. ; Begalli, M. ; Saracco, P. ; Kim, Chan Hyeong. / Atomic parameters for Monte Carlo transport simulation : Survey, validation and induced systematic effects. IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. pp. 90-94 (IEEE Nuclear Science Symposium Conference Record).
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Seo, H, Pia, MG, Quintieri, L, Begalli, M, Saracco, P & Kim, CH 2010, Atomic parameters for Monte Carlo transport simulation: Survey, validation and induced systematic effects. in IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010., 5873722, IEEE Nuclear Science Symposium Conference Record, pp. 90-94, 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010, Knoxville, TN, United States, 10/10/30. https://doi.org/10.1109/NSSMIC.2010.5873722

Atomic parameters for Monte Carlo transport simulation : Survey, validation and induced systematic effects. / Seo, H.; Pia, M. G.; Quintieri, L.; Begalli, M.; Saracco, P.; Kim, Chan Hyeong.

IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. p. 90-94 5873722 (IEEE Nuclear Science Symposium Conference Record).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Seo H, Pia MG, Quintieri L, Begalli M, Saracco P, Kim CH. Atomic parameters for Monte Carlo transport simulation: Survey, validation and induced systematic effects. In IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010. 2010. p. 90-94. 5873722. (IEEE Nuclear Science Symposium Conference Record). https://doi.org/10.1109/NSSMIC.2010.5873722