At speed HTOL test for reliability qualification of high speed mobile applications

Jongwoo Park, Ahn Da, Dong-Hee Lee, E. S. Jang, Wooyeon Kim, Sangchul Shin, Gunrae Kim, Nae In Lee, Sangwoo Pae

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, intuition is given on the Vmin shift behaviors under high speed frequency high temperature operating life (HTOL) stress conditions on Dual- and Quad-Core Application Processors (AP) fabricated with advanced High-k/Metal-gate (HK/MG) process. Unlike a constant frequency at 1 MHz, At Speed HTOL (ASH) stress tests over 1.5 GHz enables pragmatic Vmin trends. ASH Vmin results represent more realistic Vmin-shift from the viewpoint of both reliability stress and prediction of field EOL. We'll discuss Vmin shift results on ASH and its perspective as the current and future qualification tool for high speed mobile applications.

Original languageEnglish
Title of host publication2013 IEEE International Reliability Physics Symposium, IRPS 2013
DOIs
StatePublished - 2013 Aug 7
Event2013 IEEE International Reliability Physics Symposium, IRPS 2013 - Monterey, CA, United States
Duration: 2013 Apr 142013 Apr 18

Other

Other2013 IEEE International Reliability Physics Symposium, IRPS 2013
CountryUnited States
CityMonterey, CA
Period13/04/1413/04/18

Fingerprint

Temperature
Metals

Keywords

  • application processor
  • at speed HTOL
  • High-k
  • reliability qualification
  • Vmin

Cite this

Park, J., Da, A., Lee, D-H., Jang, E. S., Kim, W., Shin, S., ... Pae, S. (2013). At speed HTOL test for reliability qualification of high speed mobile applications. In 2013 IEEE International Reliability Physics Symposium, IRPS 2013 [6531995] https://doi.org/10.1109/IRPS.2013.6531995
Park, Jongwoo ; Da, Ahn ; Lee, Dong-Hee ; Jang, E. S. ; Kim, Wooyeon ; Shin, Sangchul ; Kim, Gunrae ; Lee, Nae In ; Pae, Sangwoo. / At speed HTOL test for reliability qualification of high speed mobile applications. 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 2013.
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abstract = "In this paper, intuition is given on the Vmin shift behaviors under high speed frequency high temperature operating life (HTOL) stress conditions on Dual- and Quad-Core Application Processors (AP) fabricated with advanced High-k/Metal-gate (HK/MG) process. Unlike a constant frequency at 1 MHz, At Speed HTOL (ASH) stress tests over 1.5 GHz enables pragmatic Vmin trends. ASH Vmin results represent more realistic Vmin-shift from the viewpoint of both reliability stress and prediction of field EOL. We'll discuss Vmin shift results on ASH and its perspective as the current and future qualification tool for high speed mobile applications.",
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Park, J, Da, A, Lee, D-H, Jang, ES, Kim, W, Shin, S, Kim, G, Lee, NI & Pae, S 2013, At speed HTOL test for reliability qualification of high speed mobile applications. in 2013 IEEE International Reliability Physics Symposium, IRPS 2013., 6531995, 2013 IEEE International Reliability Physics Symposium, IRPS 2013, Monterey, CA, United States, 13/04/14. https://doi.org/10.1109/IRPS.2013.6531995

At speed HTOL test for reliability qualification of high speed mobile applications. / Park, Jongwoo; Da, Ahn; Lee, Dong-Hee; Jang, E. S.; Kim, Wooyeon; Shin, Sangchul; Kim, Gunrae; Lee, Nae In; Pae, Sangwoo.

2013 IEEE International Reliability Physics Symposium, IRPS 2013. 2013. 6531995.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - In this paper, intuition is given on the Vmin shift behaviors under high speed frequency high temperature operating life (HTOL) stress conditions on Dual- and Quad-Core Application Processors (AP) fabricated with advanced High-k/Metal-gate (HK/MG) process. Unlike a constant frequency at 1 MHz, At Speed HTOL (ASH) stress tests over 1.5 GHz enables pragmatic Vmin trends. ASH Vmin results represent more realistic Vmin-shift from the viewpoint of both reliability stress and prediction of field EOL. We'll discuss Vmin shift results on ASH and its perspective as the current and future qualification tool for high speed mobile applications.

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Park J, Da A, Lee D-H, Jang ES, Kim W, Shin S et al. At speed HTOL test for reliability qualification of high speed mobile applications. In 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 2013. 6531995 https://doi.org/10.1109/IRPS.2013.6531995