Annealing effects on the microstructural and optical properties of Hg 0.7Cd0.3Te epilayers grown on CdTe buffer layers

Y. S. Ryu, T. W. Kang, Taewhan Kim

Research output: Contribution to journalArticle

Abstract

The effect on in-situ annealing on the microstructural and optical properties of Hg0.7Cd0.3Te epilayers grown on CdTe buffer layer were investigated. The carrier concentration and the mobility of the as-grown and the in-situ annealed epilayers were investigated using Hall-effect measurements. Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were performed to characterize the microstructural properties of the compounds. The results for fourier transform infrared spectroscopy (FTIR) measurements show that the transmittance intensity at the absorption edge increases after annealing.

Original languageEnglish
Pages (from-to)5303-5305
Number of pages3
JournalJournal of Materials Science
Volume40
Issue number19
DOIs
StatePublished - 2005 Oct 1

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