A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives

Dong-Hee Lee, Chang Ho Lee, Seung Hyun Choi, Kwang Jae Kim

Research output: Contribution to journalArticleResearchpeer-review

Abstract

In the semiconductor wafer fabrication process, wafers go through a series of sequential process steps. Typically, each process step has several machines, and the wafers are assigned to one whenever they enter the process step. When assigning wafers to machines, it is important to consider both the quality and productivity perspectives. Major semiconductor companies in Korea have recently implemented a wafer assignment system to improve wafer yield, a critical measure for semiconductor quality. This system, however, does not consider the productivity perspective. This paper presents a systematic method for assigning wafers to maximize the wafer yield while satisfying a predetermined target level of productivity. A simple hypothetical example is presented to illustrate the method.

Original languageEnglish
Pages (from-to)23-31
Number of pages9
JournalJournal of Manufacturing Systems
Volume52
DOIs
StatePublished - 2019 Jul 1

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Productivity
Semiconductor materials
Fabrication
Industry

Keywords

  • Emiconductor manufacture
  • Process optimization
  • Productivity and quality integration
  • Quality engineering
  • Scheduling
  • Yield management

Cite this

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abstract = "In the semiconductor wafer fabrication process, wafers go through a series of sequential process steps. Typically, each process step has several machines, and the wafers are assigned to one whenever they enter the process step. When assigning wafers to machines, it is important to consider both the quality and productivity perspectives. Major semiconductor companies in Korea have recently implemented a wafer assignment system to improve wafer yield, a critical measure for semiconductor quality. This system, however, does not consider the productivity perspective. This paper presents a systematic method for assigning wafers to maximize the wafer yield while satisfying a predetermined target level of productivity. A simple hypothetical example is presented to illustrate the method.",
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A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives. / Lee, Dong-Hee; Lee, Chang Ho; Choi, Seung Hyun; Kim, Kwang Jae.

In: Journal of Manufacturing Systems, Vol. 52, 01.07.2019, p. 23-31.

Research output: Contribution to journalArticleResearchpeer-review

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