• Source: Scopus
  • Calculated based on no. of publications stored in Pure and citations from Scopus
20042021

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  • 2020

    Optimal Design of Accelerated Life Tests for One-shot Devices

    Lee, C. & Bae, S. J., 2020 Aug, 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020. Institute of Electrical and Electronics Engineers Inc., 9209376. (2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2019

    Reliability Variation and Optimal Age Replacement Schedule of Compensated Discrete Multi-state Systems

    Dong, W., Liu, S. & Bae, S. J., 2019 May 14, 2019 IEEE 6th International Conference on Industrial Engineering and Applications, ICIEA 2019. Institute of Electrical and Electronics Engineers Inc., p. 333-337 5 p. 8714790. (2019 IEEE 6th International Conference on Industrial Engineering and Applications, ICIEA 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Step-down approach for wavelet thresholding

    Lim, M., Mun, B. M. & Bae, S. J., 2019 Jan 1, Proceedings - 25th ISSAT International Conference on Reliability and Quality in Design. Pham, H. (ed.). International Society of Science and Applied Technologies, p. 220-222 3 p. (Proceedings - 25th ISSAT International Conference on Reliability and Quality in Design).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2013

    Equivalent accelerated degradation test plans for a nonlinear random coefficients models

    Kim, S. J. & Bae, S. J., 2013, Proceedings - 19th ISSAT International Conference on Reliability and Quality in Design, RQD 2013. p. 394-398 5 p. (Proceedings - 19th ISSAT International Conference on Reliability and Quality in Design, RQD 2013).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2012

    Bayesian modeling approach for predicting residual life of two-phase degradation

    Bae, S. J., Yuan, T., Ling, S. & Kuo, W., 2012, 62nd IIE Annual Conference and Expo 2012. Institute of Industrial Engineers, (62nd IIE Annual Conference and Expo 2012).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2011

    Optimal maintenance policy of repairable system with bathtub shaped intensity

    Mun, B. M. & Bae, S. J., 2011, ICQR2MSE 2011 - Proceedings of 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering. p. 431-435 5 p. 5976646. (ICQR2MSE 2011 - Proceedings of 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • 2006

    Automated parameter selection for support vector machine decision tree

    Choi, G. & Bae, S. J., 2006, Neural Information Processing - 13th International Conference, ICONIP 2006, Proceedings. Springer Verlag, p. 746-753 8 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4233 LNCS - II).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Quality and reliability evaluation for nano-scaled devices

    Bae, S. J., Kang, C. W. & Choi, J. S., 2006, ICMIT 2006 Proceedings - 2006 IEEE International Conference on Management of Innovation and Technology. p. 798-801 4 p. 4037128. (ICMIT 2006 Proceedings - 2006 IEEE International Conference on Management of Innovation and Technology; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review