• 177 Citations
  • 9 h-Index
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Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

Chemical mechanical polishing Engineering & Materials Science
Semiconductor materials Engineering & Materials Science
Optimization Mathematics
Response Surface Mathematics
Data mining Engineering & Materials Science
Abrasives Engineering & Materials Science
Inspection Mathematics
Rule Induction Mathematics

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Research Output 2010 2019

  • 177 Citations
  • 9 h-Index
  • 20 Article
  • 7 Conference contribution
  • 1 Review article

A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives

Lee, D-H., Lee, C. H., Choi, S. H. & Kim, K. J., 2019 Jul 1, In : Journal of Manufacturing Systems. 52, p. 23-31 9 p.

Research output: Contribution to journalArticleResearchpeer-review

Semiconductor materials
Multiple Linear Regression
Regression Analysis

Generating evenly distributed nondominated solutions in dual response surface optimization

Jeong, I. J. & Lee, D-H., 2019 Jan 2, In : Quality Technology and Quantitative Management. 16, 1, p. 95-112 18 p.

Research output: Contribution to journalArticleResearchpeer-review

Response surface
Standard deviation
Decision maker
3 Citations (Scopus)

A desirability function method for optimizing mean and variability of multiple responses using a posterior preference articulation approach

Lee, D-H., Jeong, I. J. & Kim, K. J., 2018 Apr 1, In : Quality and Reliability Engineering International. 34, 3, p. 360-376 17 p.

Research output: Contribution to journalArticleResearchpeer-review

Compromise solution

Determining golden process routes in semiconductor manufacturing process for yield management

Lee, C. H., Lee, D-H., Bae, Y. M. & Kim, K. J., 2018 Feb 9, 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017. IEEE Computer Society, Vol. 2017-December. p. 2366-2370 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Semiconductor materials
Yield management
Semiconductor manufacturing