• 184 Citations
  • 9 h-Index
20102019
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Fingerprint Dive into the research topics where Dong-Hee Lee is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Semiconductor materials Engineering & Materials Science
Chemical mechanical polishing Engineering & Materials Science
Optimization Mathematics
Response Surface Mathematics
Data mining Engineering & Materials Science
Fabrication Engineering & Materials Science
Abrasives Engineering & Materials Science
Inspection Mathematics

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Research Output 2010 2019

  • 184 Citations
  • 9 h-Index
  • 22 Article
  • 7 Conference contribution
  • 1 Review article

A data-driven approach to selection of critical process steps in the semiconductor manufacturing process considering missing and imbalanced data

Lee, D-H., Yang, J. K., Lee, C. H. & Kim, K. J., 2019 Jul 1, In : Journal of Manufacturing Systems. 52, p. 146-156 11 p.

Research output: Contribution to journalArticleResearchpeer-review

Semiconductor materials
Sampling
Fabrication

A method for wafer assignment in semiconductor wafer fabrication considering both quality and productivity perspectives

Lee, D-H., Lee, C. H., Choi, S. H. & Kim, K. J., 2019 Jul 1, In : Journal of Manufacturing Systems. 52, p. 23-31 9 p.

Research output: Contribution to journalArticleResearchpeer-review

Productivity
Semiconductor materials
Fabrication
Industry
Multiple Linear Regression
Inspection
Multicollinearity
Regression Analysis
Electronics

Generating evenly distributed nondominated solutions in dual response surface optimization

Jeong, I. J. & Lee, D-H., 2019 Jan 2, In : Quality Technology and Quantitative Management. 16, 1, p. 95-112 18 p.

Research output: Contribution to journalArticleResearchpeer-review

Response surface
Standard deviation
Decision maker
Trade-offs
Compromise

Prediction of times-to-failure of semiconductor chips using VMIN data

Lee, H. & Lee, D-H., 2019 Jan 1, In : International Journal of Industrial Engineering : Theory Applications and Practice. 26, 1, p. 83-91 9 p.

Research output: Contribution to journalArticleResearchpeer-review

Semiconductor materials
Testing